ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.

The electronics industry is in the midst of a transformation that is drastically changing product design and manufacture. Deep submicron process technology puts more gates on a chip, and the ...

To compete in the fast-growing market for automotive ICs, semiconductor companies need to address new challenges across the entire design flow. To meet the ISO 26262 goal of zero defective parts per ...

Fault simulation, one of the oldest tools in the EDA industry toolbox, is receiving a serious facelift after it almost faded from existence. In the early days, fault simulation was used to grade the ...

Combining these Apps with an emulation environment makes it possible to increase fault coverage, increase production yield, and reduce ATE test time and cost. The design-for-test (DFT) technology was ...

Railway infrastructure could be made safer and more reliable using AI, artificial intelligence, according to research ...